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Defect Detection

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Showing 301–325 of 394 papers

TitleStatusHype
Defect detection and segmentation in X-Ray images of magnesium alloy castings using the Detectron2 framework—0
Wastewater Pipe Rating Model Using Natural Language Processing—0
Audio Defect Detection in Music with Deep Networks—0
Structured light dark-field microscope—0
On-the-fly 3D metrology of volumetric additive manufacturing—0
Deep learning-based defect detection of metal parts: evaluating current methods in complex conditions—0
Deep learning in automated ultrasonic NDE -- developments, axioms and opportunities—0
A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection—0
In situ process quality monitoring and defect detection for direct metal laser melting—0
TinyDefectNet: Highly Compact Deep Neural Network Architecture for High-Throughput Manufacturing Visual Quality Inspection—0
A Multi-Stage model based on YOLOv3 for defect detection in PV panels based on IR and Visible Imaging by Unmanned Aerial Vehicle—0
Defect Detection on Semiconductor Wafers by Distribution Analysis—0
Semantic Communications With AI Tasks—0
Deep Learning Strategies for Industrial Surface Defect Detection Systems—0
A Robust Asymmetric Kernel Function for Bayesian Optimization, with Application to Image Defect Detection in Manufacturing Systems—0
RoadAtlas: Intelligent Platform for Automated Road Defect Detection and Asset Management—0
S2D2Net: An Improved Approach For Robust Steel Surface Defects Diagnosis With Small Sample LearningCode0
Fast Accurate Defect Detection in Wafer Fabrication—0
Multi defect detection and analysis of electron microscopy images with deep learning—0
A Deep Learning Based Automatic Defect Analysis Framework for In-situ TEM Ion IrradiationsCode0
TL-SDD: A Transfer Learning-Based Method for Surface Defect Detection with Few Samples—0
A Cascaded Zoom-In Network for Patterned Fabric Defect Detection—0
Reference-based Defect Detection Network—0
An Uncertainty-Aware Deep Learning Framework for Defect Detection in Casting Products—0
Optical Inspection of the Silicon Micro-strip Sensors for the CBM Experiment employing Artificial Intelligence—0
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