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Defect Detection

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Showing 226–250 of 394 papers

TitleStatusHype
Integrating Artificial Intelligence Models and Synthetic Image Data for Enhanced Asset Inspection and Defect Identification—0
Intelligent detect for substation insulator defects based on CenterMask—0
Intelligent Vision Based Wear Forecasting on Surfaces of Machine Tool Elements—0
Irregularity Inspection using Neural Radiance Field—0
ISP-AD: A Large-Scale Real-World Dataset for Advancing Industrial Anomaly Detection with Synthetic and Real Defects—0
J-DDL: Surface Damage Detection and Localization System for Fighter Aircraft—0
Joint Attention-Guided Feature Fusion Network for Saliency Detection of Surface Defects—0
LaFiCMIL: Rethinking Large File Classification from the Perspective of Correlated Multiple Instance Learning—0
Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network—0
Learning Trustworthy Model from Noisy Labels based on Rough Set for Surface Defect Detection—0
LERENet: Eliminating Intra-class Differences for Metal Surface Defect Few-shot Semantic Segmentation—0
a high efficiency fully convolutional networks for pixel wise surface defect detection—0
Advancing Software Quality: A Standards-Focused Review of LLM-Based Assurance Techniques—0
LightDefectNet: A Highly Compact Deep Anti-Aliased Attention Condenser Neural Network Architecture for Light Guide Plate Surface Defect Detection—0
Lightweight wood panel defect detection method incorporating attention mechanism and feature fusion network—0
Advancing SEM Based Nano-Scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes—0
Local Flaw Detection with Adaptive Pyramid Image Fusion Across Spatial Sampling Resolution for SWRs—0
Long working distance portable smartphone microscopy for metallic mesh defect detection—0
Low-rank Convex/Sparse Thermal Matrix Approximation for Infrared-based Diagnostic System—0
Machine-learned Adversarial Attacks against Fault Prediction Systems in Smart Electrical Grids—0
Wafer Map Defect Patterns Semi-Supervised Classification Using Latent Vector Representation—0
Machine Learning for Pre/Post Flight UAV Rotor Defect Detection Using Vibration Analysis—0
Observational and Experimental Insights into Machine Learning-Based Defect Classification in Wafers—0
Autoencoder-Based Visual Anomaly Localization for Manufacturing Quality Control—0
MemoryMamba: Memory-Augmented State Space Model for Defect Recognition—0
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