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F-ANcGAN: An Attention-Enhanced Cycle Consistent Generative Adversarial Architecture for Synthetic Image Generation of Nanoparticles

2025-05-23Code Available0· sign in to hype

Varun Ajith, Anindya Pal, Saumik Bhattacharya, Sayantari Ghosh

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Abstract

Nanomaterial research is becoming a vital area for energy, medicine, and materials science, and accurate analysis of the nanoparticle topology is essential to determine their properties. Unfortunately, the lack of high-quality annotated datasets drastically hinders the creation of strong segmentation models for nanoscale imaging. To alleviate this problem, we introduce F-ANcGAN, an attention-enhanced cycle consistent generative adversarial system that can be trained using a limited number of data samples and generates realistic scanning electron microscopy (SEM) images directly from segmentation maps. Our model uses a Style U-Net generator and a U-Net segmentation network equipped with self-attention to capture structural relationships and applies augmentation methods to increase the variety of the dataset. The architecture reached a raw FID score of 17.65 for TiO_2 dataset generation, with a further reduction in FID score to nearly 10.39 by using efficient post-processing techniques. By facilitating scalable high-fidelity synthetic dataset generation, our approach can improve the effectiveness of downstream segmentation task training, overcoming severe data shortage issues in nanoparticle analysis, thus extending its applications to resource-limited fields.

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Benchmark Results

DatasetModelMetricClaimedVerifiedStatus
TiO_2 nanoparticleF-ANcGANFID17.65Unverified
TiO_2 nanoparticleCycle GANFID52.01Unverified
TiO_2 nanoparticleGenerative Adversarial Network (GAN)FID69.9Unverified

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