Alerts in High-resolution TEM characterization of perovskite material
Yu-Hao Deng
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ReproduceAbstract
High-resolution TEM (HRTEM) is a powerful tool for structure characterization. However, MAPbI3 perovskite is highly sensitive to electron beams and easily decompose into PbI2. Universal mistakes that PbI2 is incorrectly labeled as perovskite are widely exist in HRTEM characterizations, which negatively affect the development of perovskite research field. Here complete errors in MAPbI3 perovskite calibration are statisticed, classified and identified based on corresponding electron diffraction (ED) simulations. Corrected material phases, ED patterns of original PbI2 and obvious crystallographic parameters are also presented. This approach paves the way to avoid misleadings in HRTEM characterization of perovskite and other electron beam-sensitive materials in the future.